Stance Detection using Two Popular Benchmarks: A Survey

dc.contributor.authorAlqasemi, Fahd
dc.contributor.authorAl-Baadani, Hamdi
dc.contributor.authorAl-Hagery, Mohammed Abdullah
dc.date.accessioned2026-06-14T22:56:34Z
dc.date.issued2022
dc.description.abstractThe task of extracting knowledge from text is a significant process of many intelligent applications. Stance detection is one of the strongly coming learning-based objectives. Especially, on social media (SM) available huge text. Since SN content is increasing massively every second. The tasks of stance detection (StD), like any learning-based process, need to train and test on a robust pre-made dataset benchmark. The English language has the most available benchmarks sources. Occasionally, an StD researcher needs to gain deep knowledge about these researches involving a particular domain before establishing research scope and objectives. This study aimed to help StD researchers in this emerged field; i.e. StD. A focused review on a specific domain is presented. Two StD benchmarks on English are determined as the domain of StD surveyed papers. StD Challenges and problems are introduced beside the StD models investigation. This survey�s first goal is a point to the stance detection concept and the two popular benchmarks. The second is to discuss StD involved models and managed problems.en_US
dc.identifier10.1109/eSmarTA56775.2022.9935138
dc.identifier.citationAlqasemi, F., Al-Baadani, H., & Al-Hagery, M. A. (2022). Stance detection using two popular benchmarks: A survey. In�2022 2nd International Conference on Emerging Smart Technologies and Applications (eSmarTA)�(pp. 96-101). IEEE.�https://doi.org/10.1109/eSmarTA56775.2022.9935138en_US
dc.identifier.urihttps://repository.ust.edu.ye/handle/123456789/358
dc.identifier.urihttps://ieeexplore.ieee.org/abstract/document/9935138
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.titleStance Detection using Two Popular Benchmarks: A Surveyen_US
dc.typeConference Paperen_US

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